Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging

We develop an algorithm for feature extraction based on structural similarity and demonstrate its application for atom and pattern finding in high-resolution electron and scanning probe microscopy images. The use of the combined local identifiers formed from an image subset and appended Fourier, or...

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Détails bibliographiques
Publié dans:Adv Struct Chem Imaging
Auteurs principaux: Somnath, Suhas, Smith, Christopher R., Kalinin, Sergei V., Chi, Miaofang, Borisevich, Albina, Cross, Nicholas, Duscher, Gerd, Jesse, Stephen
Format: Artigo
Langue:Inglês
Publié: Springer International Publishing 2018
Sujets:
Research
Accès en ligne:https://ncbi.nlm.nih.gov/pmc/articles/PMC5846807/
https://ncbi.nlm.nih.gov/pubmed/29568723
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40679-018-0052-y
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