Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging

We develop an algorithm for feature extraction based on structural similarity and demonstrate its application for atom and pattern finding in high-resolution electron and scanning probe microscopy images. The use of the combined local identifiers formed from an image subset and appended Fourier, or...

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Detalhes bibliográficos
Publicado no:Adv Struct Chem Imaging
Main Authors: Somnath, Suhas, Smith, Christopher R., Kalinin, Sergei V., Chi, Miaofang, Borisevich, Albina, Cross, Nicholas, Duscher, Gerd, Jesse, Stephen
Formato: Artigo
Idioma:Inglês
Publicado em: Springer International Publishing 2018
Assuntos:
Research
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5846807/
https://ncbi.nlm.nih.gov/pubmed/29568723
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40679-018-0052-y
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