Feature extraction via similarity search: application to atom finding and denoising in electron and scanning probe microscopy imaging

We develop an algorithm for feature extraction based on structural similarity and demonstrate its application for atom and pattern finding in high-resolution electron and scanning probe microscopy images. The use of the combined local identifiers formed from an image subset and appended Fourier, or...

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Bibliografiset tiedot
Julkaisussa:Adv Struct Chem Imaging
Päätekijät: Somnath, Suhas, Smith, Christopher R., Kalinin, Sergei V., Chi, Miaofang, Borisevich, Albina, Cross, Nicholas, Duscher, Gerd, Jesse, Stephen
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Springer International Publishing 2018
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Research
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC5846807/
https://ncbi.nlm.nih.gov/pubmed/29568723
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s40679-018-0052-y
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