載入...
Rapid and Accurate C-V Measurements
We report a new technique for the rapid measurement of full capacitance-voltage (C-V) characteristic curves. The displacement current from a 100 MHz applied sine-wave, which swings from accumulation to strong inversion, is digitized directly using an oscilloscope from the metal-oxide-semiconductor (...
Na minha lista:
| 發表在: | IEEE Trans Electron Devices |
|---|---|
| Main Authors: | , , , , , , |
| 格式: | Artigo |
| 語言: | Inglês |
| 出版: |
2016
|
| 主題: | |
| 在線閱讀: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5455788/ https://ncbi.nlm.nih.gov/pubmed/28579633 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/TED.2016.2598855 |
| 標簽: |
添加標簽
沒有標簽, 成為第一個標記此記錄!
|