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Rapid and Accurate C-V Measurements
We report a new technique for the rapid measurement of full capacitance-voltage (C-V) characteristic curves. The displacement current from a 100 MHz applied sine-wave, which swings from accumulation to strong inversion, is digitized directly using an oscilloscope from the metal-oxide-semiconductor (...
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| Publicado no: | IEEE Trans Electron Devices |
|---|---|
| Main Authors: | , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2016
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5455788/ https://ncbi.nlm.nih.gov/pubmed/28579633 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/TED.2016.2598855 |
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