Local field effect on charge-capture/emission dynamics

Por Cheung, Kin P., Veksler, Dmitry, Campbell, Jason P.
Publicado no IEEE Trans Electron Devices (2017)

Nanoscale MOSFET as a Potential Room-Temperature Quantum Current Source

Por Cheung, Kin P., Wang, Chen, Campbell, Jason P.
Publicado no Micromachines (Basel) (2020)

Ferroelectricity in Polar Polymer-based FETs: A Hysteresis Analysis

Por Georgiou, Vasileia, Veksler, Dmitry, Campbell, Jason P., Shrestha, Pragya R., Ryan, Jason T., Ioannou, Dimitris E., Cheung, Kin P.
Publicado no Adv Funct Mater (2018)

Rapid and Accurate C-V Measurements

Por Kim, Ji-Hong, Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Nminibapiel, David, Kopanski, Joseph J., Cheung, Kin P.
Publicado no IEEE Trans Electron Devices (2016)

Impact of RRAM Read Fluctuations on the Program-Verify Approach

Por Nminibapiel, David M., Veksler, Dmitry, Kim, J.-H., Shrestha, Pragya R., Campbell, Jason P., Ryan, Jason T., Baumgart, Helmut, Cheung, Kin. P.
Publicado no IEEE Electron Device Lett (2017)

Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station

Por McCrory, Duane J., Anders, Mark A., Ryan, Jason T., Shrestha, Pragya R., Cheung, Kin P., Lenahan, Patrick M., Campbell, Jason P.
Publicado no IEEE Trans Device Mater Reliab (2018)

Slow- and rapid-scan frequency-swept electrically detected magnetic resonance of MOSFETs with a non-resonant microwave probe within a semiconductor wafer-probing station

Por McCrory, Duane J., Anders, Mark A., Ryan, Jason T., Shrestha, Pragya R., Cheung, Kin P., Lenahan, Patrick M., Campbell, Jason P.
Publicado no Rev Sci Instrum (2019)

Observation of Strong Reflection of Electron Waves Exiting a Ballistic Channel at Low Energy

Por Vaz, Canute I., Liu, Changze, Campbell, Jason P., Ryan, Jason T., Southwick, Richard G., Gundlach, David, Oates, Anthony S., Huang, Ru, Cheung, Kin. P.
Publicado no AIP Adv (2016)