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Local field effect on charge-capture/emission dynamics
Charge-capture/emission is ubiquitous in electron devices. Its dynamics often play critical roles in device operation and reliability. Treatment of this basic process is found in many text books and is considered well understood. As in many electron device models, the individuality of immobile charg...
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| Publicado no: | IEEE Trans Electron Devices |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2017
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5783311/ https://ncbi.nlm.nih.gov/pubmed/29375150 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/TED.2017.2764804 |
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