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Cryogenic Etching of High Aspect Ratio 400 nm Pitch Silicon Gratings

The cryogenic process and Bosch process are two widely used processes for reactive ion etching of high aspect ratio silicon structures. This paper focuses on the cryogenic deep etching of 400 nm pitch silicon gratings with various etching mask materials including polymer, Cr, SiO(2) and Cr-on-polyme...

Disgrifiad llawn

Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:J Microelectromech Syst
Prif Awduron: Miao, Houxun, Chen, Lei, Mirzaeimoghri, Mona, Kasica, Richard, Wen, Han
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: 2016
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC5084849/
https://ncbi.nlm.nih.gov/pubmed/27799726
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/JMEMS.2016.2593339
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