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Cryogenic Etching of High Aspect Ratio 400 nm Pitch Silicon Gratings

The cryogenic process and Bosch process are two widely used processes for reactive ion etching of high aspect ratio silicon structures. This paper focuses on the cryogenic deep etching of 400 nm pitch silicon gratings with various etching mask materials including polymer, Cr, SiO(2) and Cr-on-polyme...

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Detalhes bibliográficos
Publicado no:J Microelectromech Syst
Main Authors: Miao, Houxun, Chen, Lei, Mirzaeimoghri, Mona, Kasica, Richard, Wen, Han
Formato: Artigo
Idioma:Inglês
Publicado em: 2016
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC5084849/
https://ncbi.nlm.nih.gov/pubmed/27799726
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1109/JMEMS.2016.2593339
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