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High-bandwidth multimode self-sensing in bimodal atomic force microscopy
Using standard microelectromechanical system (MEMS) processes to coat a microcantilever with a piezoelectric layer results in a versatile transducer with inherent self-sensing capabilities. For applications in multifrequency atomic force microscopy (MF-AFM), we illustrate that a single piezoelectric...
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| Publicat a: | Beilstein J Nanotechnol |
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| Autors principals: | , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
Beilstein-Institut
2016
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4778537/ https://ncbi.nlm.nih.gov/pubmed/26977385 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.7.26 |
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