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Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy

An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is typically employed for its n...

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Bibliografski detalji
Izdano u:Beilstein J Nanotechnol
Glavni autori: Harcombe, David M, Ruppert, Michael G, Ragazzon, Michael R P, Fleming, Andrew J
Format: Artigo
Jezik:Inglês
Izdano: Beilstein-Institut 2018
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC5815288/
https://ncbi.nlm.nih.gov/pubmed/29515961
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.47
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