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Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy
An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is typically employed for its n...
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| Izdano u: | Beilstein J Nanotechnol |
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| Glavni autori: | , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
Beilstein-Institut
2018
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC5815288/ https://ncbi.nlm.nih.gov/pubmed/29515961 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.9.47 |
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