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Cracks observed to propagate discontinuously on the millisecond timescale

Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.

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Bibliographische Detailangaben
Veröffentlicht in:IUCrJ
1. Verfasser: Tanner, Brian K.
Format: Artigo
Sprache:Inglês
Veröffentlicht: International Union of Crystallography 2016
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4775155/
https://ncbi.nlm.nih.gov/pubmed/27006770
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252516002359
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