लोड हो रहा है...
Cracks observed to propagate discontinuously on the millisecond timescale
Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.
में बचाया:
| में प्रकाशित: | IUCrJ |
|---|---|
| मुख्य लेखक: | |
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
International Union of Crystallography
2016
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4775155/ https://ncbi.nlm.nih.gov/pubmed/27006770 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252516002359 |
| टैग : |
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