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Cracks observed to propagate discontinuously on the millisecond timescale

Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.

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Bibliografski detalji
Izdano u:IUCrJ
Glavni autor: Tanner, Brian K.
Format: Artigo
Jezik:Inglês
Izdano: International Union of Crystallography 2016
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC4775155/
https://ncbi.nlm.nih.gov/pubmed/27006770
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252516002359
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