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Cracks observed to propagate discontinuously on the millisecond timescale

Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.

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Bibliografische gegevens
Gepubliceerd in:IUCrJ
Hoofdauteur: Tanner, Brian K.
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: International Union of Crystallography 2016
Onderwerpen:
Online toegang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4775155/
https://ncbi.nlm.nih.gov/pubmed/27006770
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252516002359
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