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Cracks observed to propagate discontinuously on the millisecond timescale

Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.

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Bibliografiske detaljer
Udgivet i:IUCrJ
Hovedforfatter: Tanner, Brian K.
Format: Artigo
Sprog:Inglês
Udgivet: International Union of Crystallography 2016
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC4775155/
https://ncbi.nlm.nih.gov/pubmed/27006770
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252516002359
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