Φορτώνει......
Cracks observed to propagate discontinuously on the millisecond timescale
Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | IUCrJ |
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| Κύριος συγγραφέας: | |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
International Union of Crystallography
2016
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4775155/ https://ncbi.nlm.nih.gov/pubmed/27006770 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252516002359 |
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