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Cracks observed to propagate discontinuously on the millisecond timescale

Ultra-fast diffraction and phase contrast imaging experiments on crack propagation in silicon, reported in the current issue of IUCrJ, are reviewed in the light of our present knowledge and its industrial importance.

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Vydáno v:IUCrJ
Hlavní autor: Tanner, Brian K.
Médium: Artigo
Jazyk:Inglês
Vydáno: International Union of Crystallography 2016
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC4775155/
https://ncbi.nlm.nih.gov/pubmed/27006770
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S2052252516002359
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