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Direct evidence on Ta-Metal Phases Igniting Resistive Switching in TaO(x) Thin Film

A Ta/TaO(x)/Pt stacked capacitor-like device for resistive switching was fabricated and examined. The tested device demonstrated stable resistive switching characteristics including uniform distribution of resistive switching operational parameters, highly promising endurance, and retention properti...

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Dades bibliogràfiques
Publicat a:Sci Rep
Autors principals: Kyu Yang, Min, Ju, Hyunsu, Hwan Kim, Gun, Lee, Jeon-Kook, Ryu, Han-Cheol
Format: Artigo
Idioma:Inglês
Publicat: Nature Publishing Group 2015
Matèries:
Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC4568465/
https://ncbi.nlm.nih.gov/pubmed/26365532
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep14053
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