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Direct evidence on Ta-Metal Phases Igniting Resistive Switching in TaO(x) Thin Film

A Ta/TaO(x)/Pt stacked capacitor-like device for resistive switching was fabricated and examined. The tested device demonstrated stable resistive switching characteristics including uniform distribution of resistive switching operational parameters, highly promising endurance, and retention properti...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Kyu Yang, Min, Ju, Hyunsu, Hwan Kim, Gun, Lee, Jeon-Kook, Ryu, Han-Cheol
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group 2015
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC4568465/
https://ncbi.nlm.nih.gov/pubmed/26365532
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep14053
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