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Direct growth of freestanding GaN on C-face SiC by HVPE

In this work, high quality GaN crystal was successfully grown on C-face 6H-SiC by HVPE using a two steps growth process. Due to the small interaction stress between the GaN and the SiC substrate, the GaN was self-separated from the SiC substrate even with a small thickness of about 100 μm. Moreover,...

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Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Cyhoeddwyd yn:Sci Rep
Prif Awduron: Tian, Yuan, Shao, Yongliang, Wu, Yongzhong, Hao, Xiaopeng, Zhang, Lei, Dai, Yuanbin, Huo, Qin
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: Nature Publishing Group 2015
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC4451798/
https://ncbi.nlm.nih.gov/pubmed/26034939
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep10748
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