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Formation of Nanocomposites by Oxidizing Annealing of SiO(x) and SiO(x)<Er,F> Films: Ellipsometry and FTIR Analysis
The structural-phase transformations induced by air annealing of SiO(x) and SiO(x) < Er,F > films were studied by the combined use of infrared spectroscopy and ellipsometry. The films were prepared using vacuum evaporation of SiO powder and co-evaporation of SiO and ErF(3) powders. The anneali...
में बचाया:
| में प्रकाशित: | Nanoscale Res Lett |
|---|---|
| मुख्य लेखकों: | , , , , , |
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
Springer US
2015
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4447741/ https://ncbi.nlm.nih.gov/pubmed/26034423 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-015-0933-0 |
| टैग : |
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