Formation of Nanocomposites by Oxidizing Annealing of SiO(x) and SiO(x)<Er,F> Films: Ellipsometry and FTIR Analysis

The structural-phase transformations induced by air annealing of SiO(x) and SiO(x) < Er,F > films were studied by the combined use of infrared spectroscopy and ellipsometry. The films were prepared using vacuum evaporation of SiO powder and co-evaporation of SiO and ErF(3) powders. The anneali...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:Nanoscale Res Lett
Päätekijät: Sopinskyy, Mykola V, Vlasenko, Natalya A, Lisovskyy, Igor P, Zlobin, Sergii O, Tsybrii, Zinoviia F, Veligura, Lyudmyla I
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Springer US 2015
Aiheet:
Nano Express
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC4447741/
https://ncbi.nlm.nih.gov/pubmed/26034423
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/s11671-015-0933-0
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