Laddar...
Monitoring the thin film formation during sputter deposition of vanadium carbide
The thin film formation of magnetron sputtered polycrystalline coatings was monitored by in situ X-ray reflectivity measurements. The measured intensity was analyzed using the Parratt algorithm for time-dependent thin film systems. Guidelines for the on-line interpretation of the data were developed...
Sparad:
| I publikationen: | J Synchrotron Radiat |
|---|---|
| Huvudupphovsmän: | , , , , , , , , , |
| Materialtyp: | Artigo |
| Språk: | Inglês |
| Publicerad: |
International Union of Crystallography
2015
|
| Ämnen: | |
| Länkar: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4294025/ https://ncbi.nlm.nih.gov/pubmed/25537591 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577514024412 |
| Taggar: |
Lägg till en tagg
Inga taggar, Lägg till första taggen!
|