A carregar...
Dielectric properties of porous silicon for use as a substrate for the on-chip integration of millimeter-wave devices in the frequency range 140 to 210 GHz
In this work, the dielectric properties of porous Si for its use as a local substrate material for the integration on the Si wafer of millimeter-wave devices were investigated in the frequency range 140 to 210 GHz. Broadband electrical characterization of coplanar waveguide transmission lines (CPW T...
Na minha lista:
| Main Authors: | , |
|---|---|
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Springer
2014
|
| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC4148683/ https://ncbi.nlm.nih.gov/pubmed/25206316 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-9-418 |
| Tags: |
Adicionar Tag
Sem tags, seja o primeiro a adicionar uma tag!
|