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Fabrication of nanochannels with ladder nanostructure at the bottom using AFM nanoscratching method

This letter presents a novel atomic force microscopy (AFM)-based nanomanufacturing method combining the tip scanning with the high-precision stage movement to fabricate nanochannels with ladder nanostructure at the bottom by continuous scanning with a fixed scan size. Different structures can be obt...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Yan, Yongda, Geng, Yanquan, Hu, Zhenjiang, Zhao, Xuesen, Yu, Bowen, Zhang, Qi
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Springer 2014
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC4039066/
https://ncbi.nlm.nih.gov/pubmed/24940171
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-9-212
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