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Fabrication of Nanoscale Pits with High Throughput on Polymer Thin Film Using AFM Tip-Based Dynamic Plowing Lithography

Abstract We show that an atomic force microscope (AFM) tip-based dynamic plowing lithography (DPL) approach can be used to fabricate nanoscale pits with high throughput. The method relies on scratching with a relatively large speed over a sample surface in tapping mode, which is responsible for the...

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Detalhes bibliográficos
Main Authors: Yang He, Yanquan Geng, Yongda Yan, Xichun Luo
Formato: Artigo
Idioma:Inglês
Publicado em: SpringerOpen 2017-09-01
Colecção:Nanoscale Research Letters
Assuntos:
AFM
DPL
Acesso em linha:http://link.springer.com/article/10.1186/s11671-017-2319-y
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