Scanning Transmission Electron Microscopy at High Resolution

We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 Å resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as deter...

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Bibliografiske detaljer

Udgivet i:	Proc Natl Acad Sci U S A
Principais autores:	Wall, J., Langmore, J., Isaacson, M., Crewe, A. V.
Format:	Artigo
Sprog:	Inglês
Udgivet:	National Academy of Sciences 1974
Fag:	Physical Sciences: Physics
Online adgang:	https://ncbi.nlm.nih.govhttps://pmc.ncbi.nlm.nih.gov/articles/PMC387919/ https://ncbi.nlm.nih.govhttps://pubmed.ncbi.nlm.nih.gov/4521050/ https://ncbi.nlm.nih.govhttps://doi.org/10.1073/pnas.71.1.1
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