Scanning Transmission Electron Microscopy at High Resolution
We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 Å resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as deter...
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| Vydáno v: | Proc Natl Acad Sci U S A |
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| Hlavní autoři: | , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
National Academy of Sciences
1974
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.govhttps://pmc.ncbi.nlm.nih.gov/articles/PMC387919/ https://ncbi.nlm.nih.govhttps://pubmed.ncbi.nlm.nih.gov/4521050/ https://ncbi.nlm.nih.govhttps://doi.org/10.1073/pnas.71.1.1 |
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