Scanning Transmission Electron Microscopy at High Resolution
We have shown that a scanning transmission electron microscope with a high brightness field emission source is capable of obtaining better than 3 Å resolution using 30 to 40 keV electrons. Elastic dark field images of single atoms of uranium and mercury are shown which demonstrate this fact as deter...
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| 出版年: | Proc Natl Acad Sci U S A |
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| 主要な著者: | , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
National Academy of Sciences
1974
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.govhttps://pmc.ncbi.nlm.nih.gov/articles/PMC387919/ https://ncbi.nlm.nih.govhttps://pubmed.ncbi.nlm.nih.gov/4521050/ https://ncbi.nlm.nih.govhttps://doi.org/10.1073/pnas.71.1.1 |
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