Scanning Electron Microscopy

Today, an individual would be hard-pressed to find any science field that does not employ methods and instruments based on the use of fine focused electron and ion beams. Well instrumented and supplemented with advanced methods and techniques, SEMs provide possibilities not only of surface imaging b...

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Bibliografske podrobnosti

Korporativna značnica:	Kazmiruk, Viacheslav
Format:	Livro
Jezik:	Inglês
Izdano:	IntechOpen 2012
Teme:	thema EDItEUR::P Mathematics and Science::PH Physics::PHJ Optical physics::PHJL Laser physics Optical physics
Online dostop:	https://directory.doabooks.org/handle/20.500.12854/129145
Oznake:	Označite Brez oznak, prvi označite!