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Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures
A modified version of the statistical dynamical diffraction theory (mSDDT) permits full-pattern fitting of high-resolution X-ray diffraction scans from thin-film systems across the entire range from fully dynamic to fully kinematic scattering. The mSDDT analysis has been applied to a set of model Si...
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| Hlavní autoři: | , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
International Union of Crystallography
2013
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3769062/ https://ncbi.nlm.nih.gov/pubmed/24046498 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0021889813011308 |
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