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Modified statistical dynamical diffraction theory: analysis of model SiGe heterostructures

A modified version of the statistical dynamical diffraction theory (mSDDT) permits full-pattern fitting of high-resolution X-ray diffraction scans from thin-film systems across the entire range from fully dynamic to fully kinematic scattering. The mSDDT analysis has been applied to a set of model Si...

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Detalles Bibliográficos
Main Authors: Shreeman, P. K., Dunn, K. A., Novak, S. W., Matyi, R. J.
Formato: Artigo
Idioma:Inglês
Publicado: International Union of Crystallography 2013
Assuntos:
Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC3769062/
https://ncbi.nlm.nih.gov/pubmed/24046498
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0021889813011308
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