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A Monochromatic, Aberration-Corrected, Dual-Beam Low Energy Electron Microscope
The monochromatic, aberration-corrected, dual-beam low energy electron microscope (MAD-LEEM) is a novel instrument aimed at imaging of nanostructures and surfaces at sub-nanometer resolution that includes a monochromator, aberration corrector and dual beam illumination. The monochromator reduces the...
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| Main Authors: | , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
2013
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3729636/ https://ncbi.nlm.nih.gov/pubmed/23582636 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2013.02.018 |
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