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Wetting layer evolution and its temperature dependence during self-assembly of InAs/GaAs quantum dots

For InAs/GaAs(001) quantum dot (QD) system, the wetting layer (WL) evolution and its temperature dependence were studied using reflectance difference spectroscopy and were analyzed with a rate equation model. WL thicknesses showed a monotonic increase at relatively low growth temperatures but showed...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Zhang, Hongyi, Chen, Yonghai, Zhou, Guanyu, Tang, Chenguang, Wang, Zhanguo
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Springer 2012
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC3552827/
https://ncbi.nlm.nih.gov/pubmed/23110846
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-600
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