Nalaganje...

Mechanical Deformation Induced in Si and GaN Under Berkovich Nanoindentation

Details of Berkovich nanoindentation-induced mechanical deformation mechanisms of single-crystal Si(100) and the metal-organic chemical-vapor deposition (MOCVD) derived GaN thin films have been systematic investigated by means of micro-Raman spectroscopy and cross-sectional transmission electron mic...

Popoln opis

Shranjeno v:
Bibliografske podrobnosti
Glavni avtor: Jian, Sheng-Rui
Format: Artigo
Jezik:Inglês
Izdano: Springer 2007
Teme:
Online dostop:https://ncbi.nlm.nih.gov/pmc/articles/PMC3244777/
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s11671-007-9106-0
Oznake: Označite
Brez oznak, prvi označite!