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Mechanical Deformation Induced in Si and GaN Under Berkovich Nanoindentation

Details of Berkovich nanoindentation-induced mechanical deformation mechanisms of single-crystal Si(100) and the metal-organic chemical-vapor deposition (MOCVD) derived GaN thin films have been systematic investigated by means of micro-Raman spectroscopy and cross-sectional transmission electron mic...

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Detalhes bibliográficos
Autor principal: Jian, Sheng-Rui
Formato: Artigo
Idioma:Inglês
Publicado em: Springer 2007
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3244777/
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s11671-007-9106-0
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