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Conductive-probe atomic force microscopy characterization of silicon nanowire
The electrical conduction properties of lateral and vertical silicon nanowires (SiNWs) were investigated using a conductive-probe atomic force microscopy (AFM). Horizontal SiNWs, which were synthesized by the in-plane solid-liquid-solid technique, are randomly deployed into an undoped hydrogenated a...
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| Main Authors: | , , , , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Springer
2011
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3211155/ https://ncbi.nlm.nih.gov/pubmed/21711623 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-110 |
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