Dyfyniad APA

Alvarez, J., Ngo, I., Gueunier-Farret, M., Kleider, J., Yu, L., Cabarrocas, P. R., . . . Simonato, J. (2011). Conductive-probe atomic force microscopy characterization of silicon nanowire. Springer.

Dyfyniad Arddull Chicago

Alvarez, José, et al. Conductive-probe Atomic Force Microscopy Characterization of Silicon Nanowire. Springer, 2011.

Dyfyniad MLA

Alvarez, José, et al. Conductive-probe Atomic Force Microscopy Characterization of Silicon Nanowire. Springer, 2011.

Rhybudd: Mae'n bosib nad yw'r dyfyniadau hyn bob amser yn 100% cywir.