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Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins
Odd electron diffraction patterns (EDPs) have been obtained by transmission electron microscopy (TEM) on silicon nanowires grown via the vapour–liquid–solid method and on silicon thin films deposited by electron beam evaporation. Many explanations have been given in the past, without consensus among...
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| Main Authors: | , , , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2009
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3246813/ https://ncbi.nlm.nih.gov/pubmed/22477767 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0021889808042131 |
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