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The atomic force microscope as a mechano–electrochemical pen
We demonstrate a method that allows the controlled writing of metallic patterns on the nanometer scale using the tip of an atomic force microscope (AFM) as a “mechano–electrochemical pen”. In contrast to previous experiments, no voltage is applied between the AFM tip and the sample surface. Instead,...
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| Main Authors: | , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Beilstein-Institut
2011
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3201618/ https://ncbi.nlm.nih.gov/pubmed/22043454 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.2.70 |
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