Obermair, C., Wagner, A., & Schimmel, T. (2011). The atomic force microscope as a mechano–electrochemical pen. Beilstein-Institut.
Citación estilo ChicagoObermair, Christian, Andreas Wagner, y Thomas Schimmel. The Atomic Force Microscope As a Mechano–electrochemical Pen. Beilstein-Institut, 2011.
Cita MLAObermair, Christian, Andreas Wagner, y Thomas Schimmel. The Atomic Force Microscope As a Mechano–electrochemical Pen. Beilstein-Institut, 2011.
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