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Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials
We demonstrate that single-pass Kelvin force microscopy (KFM) and capacitance gradient (dC/dZ) measurements with force gradient detection of tip–sample electrostatic interactions can be performed in the intermittent contact regime in different environments. Such combination provides sensitive detect...
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| Autori principali: | , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
Beilstein-Institut
2011
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3045941/ https://ncbi.nlm.nih.gov/pubmed/21977411 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.2.2 |
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