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Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials

We demonstrate that single-pass Kelvin force microscopy (KFM) and capacitance gradient (dC/dZ) measurements with force gradient detection of tip–sample electrostatic interactions can be performed in the intermittent contact regime in different environments. Such combination provides sensitive detect...

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Detalhes bibliográficos
Main Authors: Magonov, Sergei, Alexander, John
Formato: Artigo
Idioma:Inglês
Publicado em: Beilstein-Institut 2011
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3045941/
https://ncbi.nlm.nih.gov/pubmed/21977411
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.2.2
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