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A clustering approach to multireference alignment of single-particle projections in electron microscopy

Two-dimensional analysis of projections of single particles acquired by an electron microscope is a useful tool to help identifying the different kinds of projections present in a dataset and their different projection directions. Such analysis is also useful to distinguish between different kinds o...

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Bibliografiske detaljer
Main Authors: Sorzano, C.O.S., Bilbao-Castro, J.R., Shkolnisky, Y., Alcorlo, M., Melero, R., Caffarena-Fernández, G., Li, M., Xu, G., Marabini, R., Carazo, J.M.
Format: Artigo
Sprog:Inglês
Udgivet: 2010
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC2893300/
https://ncbi.nlm.nih.gov/pubmed/20362059
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2010.03.011
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