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A clustering approach to multireference alignment of single-particle projections in electron microscopy
Two-dimensional analysis of projections of single particles acquired by an electron microscope is a useful tool to help identifying the different kinds of projections present in a dataset and their different projection directions. Such analysis is also useful to distinguish between different kinds o...
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| 主要な著者: | , , , , , , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2010
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2893300/ https://ncbi.nlm.nih.gov/pubmed/20362059 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2010.03.011 |
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