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Molecular Depth Profiling with Cluster SIMS and Wedges
Secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by 40 keV C(60)(+) bombardment of a 395-nm thin film of Irganox 1010 doped with four delta layers of Irganox 3114. The wedge structure creates a laterally magnified cross section of...
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| Hauptverfasser: | , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
2010
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2800856/ https://ncbi.nlm.nih.gov/pubmed/19968247 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac902313q |
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