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Energy Deposition during Molecular Depth Profiling Experiments with Cluster Ion Beams

The role of the location of energy deposition during cluster ion bombardment on the quality of molecular depth profiling was examined by varying the incident angle geometry. Cholesterol films ∼300 nm in thickness deposited onto silicon substrates were eroded using 40-keV C(60)(+) at incident angles...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Kozole, Joseph, Wucher, Andreas, Winograd, Nicholas
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: 2008
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC2553714/
https://ncbi.nlm.nih.gov/pubmed/18549239
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac8002962
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