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Cluster SIMS and the Temperature Dependence of Molecular Depth Profiles
The quality of molecular depth profiles created by erosion of organic materials by cluster ion beams exhibits a strong dependence upon temperature. To elucidate the fundamental nature of this dependence, we employ the Irganox 3114/1010 organic delta layer reference material as a model system. This d...
Tallennettuna:
| Päätekijät: | , , , , |
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| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
2012
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3341538/ https://ncbi.nlm.nih.gov/pubmed/22455606 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac2032589 |
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