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Cluster SIMS and the Temperature Dependence of Molecular Depth Profiles

The quality of molecular depth profiles created by erosion of organic materials by cluster ion beams exhibits a strong dependence upon temperature. To elucidate the fundamental nature of this dependence, we employ the Irganox 3114/1010 organic delta layer reference material as a model system. This d...

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Bibliografski detalji
Glavni autori: Mao, Dan, Wucher, Andreas, Brenes, Daniel A, Lu, Caiyan, Winograd, Nicholas
Format: Artigo
Jezik:Inglês
Izdano: 2012
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC3341538/
https://ncbi.nlm.nih.gov/pubmed/22455606
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac2032589
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