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Temperature Effects of Sputtering of Langmuir-Blodgett Multilayers
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) and atomic force microscopy (AFM) are employed to characterize a wedge-shaped crater eroded by a 40 keV C(60)(+) cluster ion beam on an organic thin film of 402 nm of barium arachidate (AA) multilayers prepared by the Langmuir-Blodgett (LB) t...
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| 主要な著者: | , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2012
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3566793/ https://ncbi.nlm.nih.gov/pubmed/23397359 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1002/sia.5082 |
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