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Molecular Depth Profiling by Wedged Crater Beveling
Time-of-flight secondary ion mass spectrometry and atomic force microscopy are employed to characterize a wedge-shaped crater eroded by a 40keV C(60)(+) cluster ion beam on an organic film of Irganox 1010 doped with Irganox 3114 delta layers. From an examination of the resulting surface, the informa...
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| 主要な著者: | , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
2011
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3158663/ https://ncbi.nlm.nih.gov/pubmed/21744861 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/ac201502w |
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