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Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling

The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Torun, H., Finkler, O., Degertekin, F. L.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: American Institute of Physics 2009
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC2721764/
https://ncbi.nlm.nih.gov/pubmed/19655988
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.3167276
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