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Athermalization in atomic force microscope based force spectroscopy using matched microstructure coupling
The authors describe a method for athermalization in atomic force microscope (AFM) based force spectroscopy applications using microstructures that thermomechanically match the AFM probes. The method uses a setup where the AFM probe is coupled with the matched structure and the displacements of both...
Tallennettuna:
| Päätekijät: | , , |
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| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
American Institute of Physics
2009
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2721764/ https://ncbi.nlm.nih.gov/pubmed/19655988 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.3167276 |
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