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Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

Atomic force microscopy (AFM) techniques have provided and continue to provide increasingly important insights into surface morphology, mechanics, and other critical material characteristics at the nanoscale. One attractive implementation involves extracting meaningful material properties, which dem...

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Bibliografiske detaljer
Udgivet i:Beilstein J Nanotechnol
Main Authors: Parvini, Cameron H, Saadi, M A S R, Solares, Santiago D
Format: Artigo
Sprog:Inglês
Udgivet: Beilstein-Institut 2020
Fag:
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC7308608/
https://ncbi.nlm.nih.gov/pubmed/32596096
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.11.77
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