Lataa...
Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy
Atomic force microscopy (AFM) techniques have provided and continue to provide increasingly important insights into surface morphology, mechanics, and other critical material characteristics at the nanoscale. One attractive implementation involves extracting meaningful material properties, which dem...
Tallennettuna:
| Julkaisussa: | Beilstein J Nanotechnol |
|---|---|
| Päätekijät: | , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
Beilstein-Institut
2020
|
| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7308608/ https://ncbi.nlm.nih.gov/pubmed/32596096 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.11.77 |
| Tagit: |
Lisää tagi
Ei tageja, Lisää ensimmäinen tagi!
|