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Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy
Atomic force microscopy (AFM) techniques have provided and continue to provide increasingly important insights into surface morphology, mechanics, and other critical material characteristics at the nanoscale. One attractive implementation involves extracting meaningful material properties, which dem...
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| Yayımlandı: | Beilstein J Nanotechnol |
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| Asıl Yazarlar: | , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
Beilstein-Institut
2020
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| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7308608/ https://ncbi.nlm.nih.gov/pubmed/32596096 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.11.77 |
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