Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy
In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods prop...
I tiakina i:
| Ngā kaituhi matua: | , , |
|---|---|
| Hōputu: | Artigo |
| Reo: | Inglês |
| I whakaputaina: |
Beilstein-Institut
2012-03-01
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| Rangatū: | Beilstein Journal of Nanotechnology |
| Ngā marau: | |
| Urunga tuihono: | https://doi.org/10.3762/bjnano.3.27 |
| Ngā Tūtohu: |
Kāore He Tūtohu, Me noho koe te mea tuatahi ki te tūtohu i tēnei pūkete!
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